Pulse-length determination techniques in the rectangular single event transient fault model

Abstract

One of the well-known models to represent Single Event Transient phenomenon at the logic-level is the rectangular pulse model. However, the pulse-length in this model has a vital contribution to the accuracy and validity of the rectangular pulse model. The work presented in this paper develops two approaches for determination of the pulse-length of the rectangular pulse model used in Single Event Transient (SET) faults. The first determination approach has been extracted from radiation testing along with transistor-level SET analysis tools. The second determination approach has been elicited from asymptotic analytical behaviour of SETs in 45-nm CMOS process. The results show that applying these two pulse-length determination approaches to the rectangular pulse model will cause the fault injection results converge much faster (up to sixteen times), compared to other conventional approaches.