Electrochemical Impedance Spectroscopy and Characterization of 20% Yttria doped Cerium on Silicon

Abstract

Bare silicon and 20% yttria stabilized ceria on a silicon substrate are annealed. The annealed substrates are analyzed at varying temperatures using electrochemical impedance spectroscopy. The impedance data is fitted against appropriate equivalent circuits and the fitted data is characterized with an Arrhenius plot and a plot of the ionic conductivity against temperature. The 20% YDC sample is found to have a high ionic conductivity, and therefore should be studied further in order to determine the practicality of using YDC as an electrolyte.