32nm FinFET Based PLL

Mahalaxmi Palinje
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Abstract

The demand for low power based circuits increases as the size of channel length decreases. But as channel length decreases it is difficult to use CMOS based circuits due to problems in its fundamental material, short channel effect and high leakage. Thus FinFET technology can be used as an alternative to classical MOSFET, to achieve low power application. The effectiveness of various Double Gate in Mixed Signal(MS) circuit level design is less explored. Phase Locked Loop (PLL) is one of the important MS circuit and are integral part of many electronic system. Extracting advantages of FinFET over above mentioned issues in PLL, this paper proposes two design of PLL using novel device DGMOS FinFET at 32nm technology. The first design of FinFET based PLL uses FinFET in shorted gate (SG) mode & the second design uses FinFET in independent gate (IG) mode for the design of Phase Frequency Detector (PFD) block. The designed circuits are simulated using HSPICE by Synopsis with 32nm FinFET technology with power supply voltage of 0.8V. Performance of designed PLL are analyzed at operating frequency of 500MHz. The comparative analysis of all the designs of PLL shows that Modified FinFET based PLL at 32nm shows better performance in terms of faster locking period at 38.34ns, high frequency operation from 500MHz to 11GHz with smaller area requiring lesser no. of transistors & having power dissipation of 86.36 µW which is comparatively low.
基于32纳米FinFET的锁相环
对低功耗电路的需求随着通道长度的减小而增加。但是随着通道长度的减小,由于CMOS的基础材料、短通道效应和高泄漏等问题,使得CMOS电路难以应用。因此,FinFET技术可以作为经典MOSFET的替代品,以实现低功耗应用。各种双门电路在混合信号电平设计中的有效性研究较少。锁相环(PLL)是一种重要的MS电路,是许多电子系统不可缺少的组成部分。针对上述问题,本文提出了两种采用新型器件DGMOS FinFET的锁相环设计方案。基于FinFET的锁相环的第一个设计在短门(SG)模式下使用FinFET;第二个设计在独立门(IG)模式下使用FinFET来设计相频检测器(PFD)模块。采用32nm FinFET技术,在0.8V电源电压下,利用HSPICE对设计的电路进行了仿真。分析了所设计锁相环在500MHz工作频率下的性能。锁相环的设计的比较分析表明,改进基于FinFET的锁相环在32 nm显示更好的性能而言,更快的锁定时间为38.34 ns,高频操作从500兆赫到11 ghz较小的区域需要较小的没有。功耗为86.36 μ W,相对较低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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