SRAM Write- and Performance-Assist Cells for Reducing Interconnect Resistance Effects Increased with Technology Scaling

Keonhee Cho, Heekyung Choi, I. Jung, J. Oh, Tae Woo Oh, Kiryong Kim, Gi-Kryang Kim, T. Choi, Changsoo Sim, T. Song, Seong-ook Jung
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引用次数: 4

Abstract

This paper presents SRAM write- and performance-assist cells that have bit-cell compatible layouts and thus can be inserted into an bit-cell array without the white space. The proposed cells can effectively resolve the degradation in write-ability and performance caused by the interconnect resistance increased with technology scaling.
SRAM写入和性能辅助单元减少互连电阻效应增加与技术规模
本文介绍了具有位单元兼容布局的SRAM写入和性能辅助单元,因此可以插入到位单元数组中而不需要空白。所提出的电池可以有效地解决由于互连电阻随技术规模的增加而导致的可写性和性能的下降。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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