Microscopic image enhancement based on Fourier ptychography technique

Abstract

Image enhancement technique is utilized to emphasize the overall or local characteristics of pictures and widely used in aerospace, and machine vision application. However, most of these techniques are mathematical algorithms based on captured pictures instead of the imaging process. Fourier ptychographic microscopy (FPM) is a recently developed computational imaging approach which stitches together low-resolution images acquired under different angles of illumination with the same intensity in Fourier space to produce a wide-field, high-resolution complex sample image. In this article, a theoretical model about the illumination intensity is proposed. The effect of uneven illumination intensity can be reduced significantly based on our model. Furthermore, the quality of the reconstructed image can be enhanced by adjusting the intensity of the illumination light corresponding to the high frequency components of the original spectrum.