Thermomechanical behavior of ceramic ball grid array based on experiments and FEM simulations

J. Delétage, A. Fenech, L. Béchou, Y. Ousten, Y. Danto, M. Salagoity, C. Faure, S. Rao
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引用次数: 5

Abstract

In this paper, we have performed 2D finite element simulations on CBGA components assembled on FR4 card in order to evaluate the highest stressed regions of the solder joint. The maximum cumulative strain energy has been calculated as a function of the thermal cycling characteristics and of the package size to evaluate the fatigue of the solder joints. Accelerated ageing tests (0/spl deg/C to 100/spl deg/C) have been performed on CBGA samples to validate such a global approach. The analysis of the degradation have been performed using direct observation with SEM and also a specific procedure of acoustic imaging allowing the detection of defects located on the inner balls. From the previous FEM simulation results and the experimental data under thermal cycling, we propose a global interpretation, based on general mechanical laws, of the thermomechanical behavior of the CBGA solder joints under thermal cycling. Conclusions about the evolution of the CBGA assemblies criticity with both package size and ball number increase are deduced from this study.
基于实验和有限元模拟的陶瓷球栅阵热力学行为
在本文中,我们对装配在FR4卡上的CBGA组件进行了二维有限元模拟,以评估焊点的最高应力区域。计算了最大累积应变能作为热循环特性和封装尺寸的函数来评估焊点的疲劳。已经对CBGA样品进行了加速老化试验(0/spl度/C至100/spl度/C),以验证这种全局方法。使用扫描电镜直接观察和声学成像的特定程序进行了退化分析,从而可以检测到位于内球上的缺陷。根据以往的有限元模拟结果和热循环下的实验数据,基于一般力学规律,提出了热循环下CBGA焊点热力学行为的全局解释。推导出了CBGA组件临界度随封装尺寸和球数增加的演化规律。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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