VerifyESD: a tool for efficient circuit level ESD simulations of mixed-signal ICs

M. Baird, R. Ida
{"title":"VerifyESD: a tool for efficient circuit level ESD simulations of mixed-signal ICs","authors":"M. Baird, R. Ida","doi":"10.1109/EOSESD.2000.890117","DOIUrl":null,"url":null,"abstract":"For many classes of technologies and circuits, it is beneficial to perform circuit simulations for ESD design, verification, and performance prediction. This is particularly true for mixed-signal ICs, where complex interaction between I/Os and multiple power supplies make manual analysis difficult and error prone. Unfortunately, high node and component counts typically prohibit simulations of an entire circuit. Thus, a manual intervention by the designer is usually required to minimize the circuit size. This paper introduces a new tool which automatically reduces the number of voltage nodes per ESD simulation by including only those devices that are necessary. In addition, a simple method for modeling ESD device failure while maintaining compatibility with existing CAD tools and libraries is discussed.","PeriodicalId":332394,"journal":{"name":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2000-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"33","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2000.890117","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 33

Abstract

For many classes of technologies and circuits, it is beneficial to perform circuit simulations for ESD design, verification, and performance prediction. This is particularly true for mixed-signal ICs, where complex interaction between I/Os and multiple power supplies make manual analysis difficult and error prone. Unfortunately, high node and component counts typically prohibit simulations of an entire circuit. Thus, a manual intervention by the designer is usually required to minimize the circuit size. This paper introduces a new tool which automatically reduces the number of voltage nodes per ESD simulation by including only those devices that are necessary. In addition, a simple method for modeling ESD device failure while maintaining compatibility with existing CAD tools and libraries is discussed.
VerifyESD:一个有效的电路级ESD混合信号ic仿真工具
对于许多类型的技术和电路,进行电路仿真有利于ESD设计、验证和性能预测。对于混合信号ic尤其如此,其中I/ o和多个电源之间的复杂交互使得手动分析变得困难且容易出错。不幸的是,高节点和组件计数通常禁止模拟整个电路。因此,通常需要设计者的人工干预来最小化电路尺寸。本文介绍了一种新工具,该工具通过只包含必要的器件来自动减少每个ESD仿真的电压节点数量。此外,还讨论了一种简单的方法来建模ESD器件故障,同时保持与现有CAD工具和库的兼容性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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