{"title":"Intelligent rapid investigation of S-Parameters (IRIS): Frequency & time domain channel analyzer","authors":"Nikita Ambasanal, Bhyrav Mutnuryz, Dipanjan Gopel","doi":"10.1109/EDAPS.2016.7874409","DOIUrl":null,"url":null,"abstract":"IRIS is a consolidated platform to analyse bulk S-Parameter data, perform operations like termination/renormalization of port impedances, conversion from single-ended to mixed mode, evaluate complex equations in S-Parameters, plug-in, View and record Violation of envelopes as defined by SATA, SAS, PCIe & USB spec sheets. It also implements a novel machine-learning based methodology [1] to efficiently bridge Frequency Domain (FD) and Time Domain (TD) by predicting Eye-Height (EH) and Eye-Widths (EW) from S-Parameters.","PeriodicalId":191549,"journal":{"name":"2016 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Electrical Design of Advanced Packaging and Systems (EDAPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDAPS.2016.7874409","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
IRIS is a consolidated platform to analyse bulk S-Parameter data, perform operations like termination/renormalization of port impedances, conversion from single-ended to mixed mode, evaluate complex equations in S-Parameters, plug-in, View and record Violation of envelopes as defined by SATA, SAS, PCIe & USB spec sheets. It also implements a novel machine-learning based methodology [1] to efficiently bridge Frequency Domain (FD) and Time Domain (TD) by predicting Eye-Height (EH) and Eye-Widths (EW) from S-Parameters.