{"title":"Development of a testing model for an intraventricular impedance imaging system","authors":"Wei Wei, S. Kun, R. Peura","doi":"10.1109/NEBC.1994.305169","DOIUrl":null,"url":null,"abstract":"Intraventricular impedance imaging (III) is a technique for assessment of cardiac function. Presently, there is a need to develop an in vitro testing system for evaluation of the III system. The aim of the research described here is to develop such a testing device. The device consists of a computerized 3D catheter positioner, a ventricular volume regulator and several ventricle simulators. These modules are controlled by a PC-based custom-built software package. The developed hardware is structured in modules. The testing model will be used for the evaluation of static and dynamic characteristics of the III system.<<ETX>>","PeriodicalId":117140,"journal":{"name":"Proceedings of 1994 20th Annual Northeast Bioengineering Conference","volume":"129 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 20th Annual Northeast Bioengineering Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEBC.1994.305169","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Intraventricular impedance imaging (III) is a technique for assessment of cardiac function. Presently, there is a need to develop an in vitro testing system for evaluation of the III system. The aim of the research described here is to develop such a testing device. The device consists of a computerized 3D catheter positioner, a ventricular volume regulator and several ventricle simulators. These modules are controlled by a PC-based custom-built software package. The developed hardware is structured in modules. The testing model will be used for the evaluation of static and dynamic characteristics of the III system.<>