{"title":"Performance enhancement of reconfigurable FET using gate workfunctlon, inter-gate length and inter-gate dielectric permittivity","authors":"P. Sadagopan, V. Vaithianathan, R. Srinivasan","doi":"10.1109/ICSCN.2017.8085734","DOIUrl":null,"url":null,"abstract":"In this paper, we have analyzed the performance enhancement of reconfigurable field effect transistor (RFET) using gate workfunction, inter-gate length and inter-gate dielectric permittivity through TCAD simulations. The parameters, ON current, OFF current and I<inf>ON</inf>/I<inf>OFF</inf> ratio are extracted from the saturated I<inf>D</inf>-V<inf>G</inf> characteristics. When the inter-gate length is varied, enhanced I<inf>ON</inf>/I<inf>OFF</inf> ratio is achieved comparing with the conventional RFET. Inter-gate dielectric permittivity variation also offers better I<inf>ON</inf>/I<inf>OFF</inf> ratio comparatively.","PeriodicalId":383458,"journal":{"name":"2017 Fourth International Conference on Signal Processing, Communication and Networking (ICSCN)","volume":"2004 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 Fourth International Conference on Signal Processing, Communication and Networking (ICSCN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSCN.2017.8085734","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this paper, we have analyzed the performance enhancement of reconfigurable field effect transistor (RFET) using gate workfunction, inter-gate length and inter-gate dielectric permittivity through TCAD simulations. The parameters, ON current, OFF current and ION/IOFF ratio are extracted from the saturated ID-VG characteristics. When the inter-gate length is varied, enhanced ION/IOFF ratio is achieved comparing with the conventional RFET. Inter-gate dielectric permittivity variation also offers better ION/IOFF ratio comparatively.
本文通过TCAD仿真分析了栅极工作函数、栅极间长度和栅极间介电常数对可重构场效应晶体管(reconfigurable field effect transistor, RFET)性能的增强作用。参数,ON电流,OFF电流和离子/IOFF比是从饱和ID-VG特性中提取的。当栅极间长度变化时,与传统的fet相比,离子/IOFF比有所提高。栅极间介电常数的变化也提供了相对较好的ION/IOFF比。