Methodology for Assessing the Quality of Genomic Assembly Based on the Analysis of K-Mers Frequency in a Parallel Sequencing Sequencer

A. G. Borodinov, V. Manoilov, I. V. Zarutskiy, A. Petrov, V. Kurochkin
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Abstract

Counting the occurrence of different k-mers often arises in problems of genome assembly. Analysis of the frequency distribution of k-mers makes it possible to find assembly errors in already formed contigs. Currently, in connection with the development of instrumentation for genetic analysis, there is an urgent need to develop methods for assessing the quality of genomic assembly. Such techniques will make it possible to assess the reliability of genetic analysis in existing and newly developed devices. In this work, based on the analysis of various software tools, programs are selected that allow assessing the quality of genomic assembly in parallel sequencing sequencers. Using the selected programs, the data obtained on the domestic sequencer for parallel sequencing Nanofor SPS were processed. Based on the results of processing these data, the quality of the genomic assembly was assessed by the method of k-mers analysis and recommendations for improving the hardware and software of the Nanofor SPS device were given.
基于平行测序仪K-Mers频率分析的基因组组装质量评估方法
计算不同k-mers的出现次数经常出现在基因组组装问题中。对k-mers的频率分布进行分析,可以在已经形成的组合中发现装配误差。目前,随着遗传分析仪器的发展,迫切需要开发评估基因组组装质量的方法。这些技术将使评估现有和新开发的设备中遗传分析的可靠性成为可能。在这项工作中,基于对各种软件工具的分析,选择了允许评估平行测序测序中基因组组装质量的程序。利用选定的程序,对国产测序仪上获得的数据进行处理,用于对Nanofor SPS进行平行测序。根据这些数据的处理结果,通过k-mers分析方法评估了基因组组装的质量,并提出了改进Nanofor SPS设备硬件和软件的建议。
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