Microstructural studies of direct-overwrite (DOW) Ag-In-Sb-Te phase-change optical recording media

Abstract

Transmission electron microscopy has been used successfully to investigate the evolution of microstructure and crystalline phase selection during repeated direct-overwriting of Ag-In-Sb-Te phase-change optical recording media. It has been shown that the mark shape is partly determined by the multipulse beam used in writing and crystallization of the edges of the molten area, due to the thermal influence of the following pulse.