{"title":"Understanding ionizing energy losses after charged particle and neutron impact in semiconductors with hybrid pixel detectors","authors":"B. Bergmann","doi":"10.1109/AE54730.2022.9920076","DOIUrl":null,"url":null,"abstract":"Hybrid pixel detectors of Timepix3 technology allow noiseless single particle detection and identification. We exploit this capability for a comprehensive study of ionizing energy losses and their spatial distribution in silicon sensors after exposure to charged particles and neutrons. (Abstract)","PeriodicalId":113076,"journal":{"name":"2022 International Conference on Applied Electronics (AE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-09-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 International Conference on Applied Electronics (AE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AE54730.2022.9920076","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Hybrid pixel detectors of Timepix3 technology allow noiseless single particle detection and identification. We exploit this capability for a comprehensive study of ionizing energy losses and their spatial distribution in silicon sensors after exposure to charged particles and neutrons. (Abstract)