Prediction of High-Temperature Operation (up to +300°C) of Reference Voltage Source Built with Temperature-Tolerant Production Technology

L. Sambursky, Dmitry A. Parfenov, M. Ismail-Zade, Alexander S. Boldov, Borislav S. Dubyaga
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Abstract

In this work, virtual testing of submicron SOI CMOS reference voltage source integrated circuit was conducted with regard to elevated temperature in the range up to + 300°C. Based on simulation results its temperature tolerance figures were estimated.
采用耐温生产技术构建的基准电压源的高温运行预测(高达+300°C)
在这项工作中,对亚微米SOI CMOS参考电压源集成电路在高达+ 300°C的高温下进行了虚拟测试。根据仿真结果估计了其耐温性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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