Improvement of the crystallinity and optical properties of sol-gel ZnO thin film by a PVD ZnO buffer layer

Shu-Yi Liu, Tao Chen, Yu-Long Jiang, G. Ru, Bingzong Li, X. Qu
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引用次数: 2

Abstract

The effect of the ZnO homo-buffer layer on the structural, optical and electrical properties of the Sol-gel ZnO films was systematically investigated. The XRD and SEM results show that the homo-buffer layer can improve the degree of the preferential c-axis orientation (the best Lotering orientation factor (F) can reach 0.915), the grain size and the surface morphology of thereon ZnO films. A narrower UV emission at 380 nm was observed with weaker deep-level visible emission for the ZnO films with a homo-buffer layer using room-temperature (RT) photoluminescence (PL) spectra. The electrical results show that the carrier concentration of the films with buffer layer is decreased and the Hall mobility is increased, indicating that a ZnO homo-buffer layer can effectively improve the crystallinity of the films and improve both electrical and optical properties.
PVD ZnO缓冲层对溶胶-凝胶ZnO薄膜结晶度和光学性能的改善
系统地研究了ZnO均匀缓冲层对ZnO溶胶-凝胶膜结构、光学和电学性能的影响。XRD和SEM结果表明,均质缓冲层可以改善ZnO薄膜的c轴优先取向程度(最佳Lotering取向因子F达到0.915),改善ZnO薄膜的晶粒尺寸和表面形貌。在室温(RT)光致发光(PL)光谱中,发现具有均匀缓冲层的ZnO薄膜在380 nm处有较窄的紫外发射和较弱的深能级可见发射。电学结果表明,有缓冲层的薄膜载流子浓度降低,霍尔迁移率提高,表明ZnO同质缓冲层可以有效改善薄膜的结晶度,提高薄膜的电学和光学性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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