MOCVD growth and thermal analysis of Sb2Te3 thin films and nanowires

M. Longo, S. Cecchi, S. Selmo, M. Fanciulli, C. Wiemer, J. Battaglia, A. Saci, A. Kusiak
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引用次数: 4

Abstract

Sb2Te3 is a chalcogenide compound of great interest, due to its applications in the fields of phase change, thermoelectric devices, as well as of topological insulators. In this work, the MOCVD deposition of both Sb2Te3 thin films and nanowires was performed by using the same set of precursors and exploiting the low temperature deposition for thin films and VLS mechanisms for nanowires. A special attention was dedicated to the analysis of the thermal properties, performed by scanning thermal microscopy and modulated photothermal radiometry techniques. The thermal conductivity of the thin layers was compared to that of a nanowire, finding that the values are comparable to those reported for bulk Sb2Te3.
Sb2Te3 薄膜和纳米线的 MOCVD 生长和热分析
Sb2Te3 是一种掺杂化合物,由于其在相变、热电设备以及拓扑绝缘体等领域的应用而备受关注。在这项工作中,使用同一套前驱体,利用薄膜的低温沉积和纳米线的 VLS 机制,对 Sb2Te3 薄膜和纳米线进行了 MOCVD 沉积。通过扫描热显微镜和调制光热辐射测量技术对热特性进行了分析。我们将薄膜的热导率与纳米线的热导率进行了比较,发现两者的热导率值与所报道的块状 Sb2Te3 的热导率值相当。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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