SELECTION OF AN OPERATIONAL FAILURE RATE MODEL FOR INTEGRATED CIRCUITS BASED ON EXPERT ANALYSIS OF OPERATING EXPERIENCE

The Second All-Russian Scientific Conference Pub Date : 2021-04-23 DOI:10.31799/978-5-8088-1558-2-2021-2-211-216

M. A. Artyukhova

引用次数: 0

Abstract

Evaluation of reliability indicators is necessary procedure in the design of a technical system. The article consider two failure rate models for integrated circuits and a number of conclusions, derived from model comparison with operating experience.

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基于专家运行经验分析的集成电路运行故障率模型选择

可靠性指标的评估是技术系统设计的必要步骤。本文考虑了集成电路的两种故障率模型，并通过模型与运行经验的比较得出了一些结论。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

The Second All-Russian Scientific Conference

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