A 0.5-18 GHz Semi-Automatic Noise Parameter Measurement Technique

Abstract

This paper will briefly describe some of the difficulties encountered in both the "classical" methods and the overdetermined methods in terms of sensitivity to measurement errors. I t will show t h a t certain patterns of reflection coefficient result in best derived parameter precision and describe a system using commercially available equipment capable of noise parameter measurements from 0.5 GHz to 18 GHz. Results will be given for both packaged and chip devices and will conclude with suggested extensions of these methods to fundamental and harmonic load pull in power devices.