Analysis of Attenuation and Dispersion for Superconducting Transmission Lines by Using the Method of Lines

D. Lin, G. Li, Z. Chen
{"title":"Analysis of Attenuation and Dispersion for Superconducting Transmission Lines by Using the Method of Lines","authors":"D. Lin, G. Li, Z. Chen","doi":"10.1109/APMC.1992.672083","DOIUrl":null,"url":null,"abstract":"In this paper, the Method of Lines has been used to calculate the attenuation and dispersion of superconducting film microstrip lines. The calculated frequency region is 0.1-1 OOCHz, the propagation characteristics of the superconducting transmission lines are studied as a function of the thickness of the superconducting film and the substrate. These results may be used in the disign of varied high Tc superconducting passive microwave and millimeter wave devices.","PeriodicalId":234490,"journal":{"name":"AMPC Asia-Pacific Microwave Conference,","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"AMPC Asia-Pacific Microwave Conference,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APMC.1992.672083","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

In this paper, the Method of Lines has been used to calculate the attenuation and dispersion of superconducting film microstrip lines. The calculated frequency region is 0.1-1 OOCHz, the propagation characteristics of the superconducting transmission lines are studied as a function of the thickness of the superconducting film and the substrate. These results may be used in the disign of varied high Tc superconducting passive microwave and millimeter wave devices.
用线法分析超导传输线的衰减和色散
本文用线法计算了超导薄膜微带线的衰减和色散。计算的频率范围为0.1-1 OOCHz,研究了超导传输线的传输特性随超导薄膜厚度和衬底厚度的变化规律。这些结果可用于各种高Tc超导无源微波和毫米波器件的设计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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