Pierre-Didier Mauroux, A. Virazel, A. Bosio, L. Dilillo, P. Girard, S. Pravossoudovitch, B. Godard
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引用次数: 7
Abstract
Embedded flash memories are dominated by the NOR architecture but NAND is becoming more and more adopted due to its high storage capacity. This paper presents a preliminary study on actual defects in NAND array.
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