Pierre Derennes, V. Chabridon, J. Morio, M. Balesdent, F. Simatos, Jean-Marc Bourinet, N. Gayton
{"title":"Nonparametric Importance Sampling Techniques for Sensitivity Analysis and Reliability Assessment of a Launcher Stage Fallout","authors":"Pierre Derennes, V. Chabridon, J. Morio, M. Balesdent, F. Simatos, Jean-Marc Bourinet, N. Gayton","doi":"10.1007/978-3-030-10501-3_3","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":250409,"journal":{"name":"Springer Optimization and Its Applications","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Springer Optimization and Its Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-10501-3_3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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