LTspice Simulation Analysis for Loss Estimation of GaN MOSFET based Class E Resonant Inverter

Kundan Kumar, Vikram Kumar Saxena
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Abstract

The class E resonant inverter is generally used in numerous applications where low power as well as high frequency is needed. The losses of class E resonant inverters are estimated in this work by considering silicon (Si) and gallium nitride (GaN) MOSFETs. Further, the function of a class E inverter, analytical steady-state analysis, and modelling of power losses are demonstrated. Moreover, a comparative analysis of class E resonant inverter using Si and GaN MOSFETs is presented considering the higher operating frequency and a compromise between the device voltage and current stresses. The simulation analysis is done with the help of LTspice to validate the theoretical analysis. It is observed that using GaN MOSFET based class E resonant inverter is capable to reduce the losses by 5–6 % (approx.) compared with the Si MOSFET based class E inverter.
基于GaN MOSFET的E类谐振逆变器损耗估计的LTspice仿真分析
E类谐振逆变器通常用于需要低功率和高频率的众多应用中。通过考虑硅(Si)和氮化镓(GaN) mosfet,估计了E类谐振逆变器的损耗。此外,还演示了E类逆变器的功能、解析稳态分析和功率损耗建模。此外,考虑到更高的工作频率以及器件电压和电流应力之间的折衷,对使用Si和GaN mosfet的E类谐振逆变器进行了比较分析。利用LTspice进行了仿真分析,验证了理论分析的正确性。我们观察到,与基于Si MOSFET的E类逆变器相比,使用基于GaN MOSFET的E类谐振逆变器能够减少5 - 6%(大约)的损耗。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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