Experimental Investigation and Analytical Modeling of Half-Bridge Switching Losses in Reconfigurable Lithium-Ion Cells

Abstract

This paper investigates the accuracy of several analytical MOSFET loss models in half-bridge configuration. As voltage source is an automotive lithium-ion cell used as done in cascaded multilevel inverters. A standard capacitance-limited model as well as two models that take the loop inductance into account are evaluated and compared to experimental data. Results show that the relative root mean square error of the capacitance-limited model has an error of up to 49.5 % while models that take the loop inductance into account dont get better than 17.7 %. A new loss model is proposed which achieves errors as low as 8.0 % while also being more intuitive. A detailed breakdown of the proposed model reveals the cause of the small error, as well as how to further improve it.