{"title":"SIFT-Rank: Ordinal description for invariant feature correspondence","authors":"M. Toews, W. Wells","doi":"10.1109/CVPR.2009.5206849","DOIUrl":null,"url":null,"abstract":"This paper investigates ordinal image description for invariant feature correspondence. Ordinal description is a meta-technique which considers image measurements in terms of their ranks in a sorted array, instead of the measurement values themselves. Rank-ordering normalizes descriptors in a manner invariant under monotonic deformations of the underlying image measurements, and therefore serves as a simple, non-parametric substitute for ad hoc scaling and thresholding techniques currently used. Ordinal description is particularly well-suited for invariant features, as the high dimensionality of state-of-the-art descriptors permits a large number of unique rank-orderings, and the computationally complex step of sorting is only required once after geometrical normalization. Correspondence trials based on a benchmark data set show that in general, rank-ordered SIFT (SIFT-rank) descriptors outperform other state-of-the-art descriptors in terms of precision-recall, including standard SIFT and GLOH.","PeriodicalId":386532,"journal":{"name":"2009 IEEE Conference on Computer Vision and Pattern Recognition","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2009-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"61","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE Conference on Computer Vision and Pattern Recognition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CVPR.2009.5206849","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 61
Abstract
This paper investigates ordinal image description for invariant feature correspondence. Ordinal description is a meta-technique which considers image measurements in terms of their ranks in a sorted array, instead of the measurement values themselves. Rank-ordering normalizes descriptors in a manner invariant under monotonic deformations of the underlying image measurements, and therefore serves as a simple, non-parametric substitute for ad hoc scaling and thresholding techniques currently used. Ordinal description is particularly well-suited for invariant features, as the high dimensionality of state-of-the-art descriptors permits a large number of unique rank-orderings, and the computationally complex step of sorting is only required once after geometrical normalization. Correspondence trials based on a benchmark data set show that in general, rank-ordered SIFT (SIFT-rank) descriptors outperform other state-of-the-art descriptors in terms of precision-recall, including standard SIFT and GLOH.