Wide-Band Gunn Diodes Based on Graded-Gap InGaP/ InP As

I. Storozhenko, M. Kaydash, O. Yaroshenko, Y. Arkusha
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Abstract

The paper presents the results of numerical experiments on the oscillation generation using the n+-n-n+ transfer electron device based on InGaP/lnPAs graded-gap semiconductor compounds at different Ga and As distributions. The active region of the diode is 2.5 µm with an ionized impurity concentration of 1016 cm−3. It is paper shown that the output power and the efficiency of Gunn generators increase several times when the InGaP/lnPAs graded-gap semiconductors are used. The reasons for this increase are considered. The highest power of 11.3 kW/cm2 with efficiency of 10.2% at frequency of 40 GHz belong to In0.4Ga0.6P/lnP0.4As0.6diode.
基于梯度隙InGaP/ InP As的宽带Gunn二极管
本文介绍了不同Ga和As分布的InGaP/lnPAs梯度隙半导体化合物的n+-n-n+转移电子器件产生振荡的数值实验结果。二极管的有源区为2.5µm,电离杂质浓度为1016 cm−3。研究表明,当使用InGaP/lnPAs梯度隙半导体时,Gunn发生器的输出功率和效率提高了数倍。对这一增长的原因进行了考虑。在40ghz频率下,In0.4Ga0.6P/ lnp0.4 as0.6二极管的最高功率为11.3 kW/cm2,效率为10.2%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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