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Investigation of Reproducibility and Repeatability Issue on EFT Test at IC Level to Microcontrollers

CCF National Conference on Computer Engineering and Technology Pub Date : 2013-07-20 DOI:10.1007/978-3-642-41635-4_18
Jianwei Su, Jiancheng Li, Jianfei Wu, Chunming Wang
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单片机集成电路级EFT测试再现性和可重复性问题的研究
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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CCF National Conference on Computer Engineering and Technology
CCF National Conference on Computer Engineering and Technology
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