An Electron-Microscope Investigation of the Lamellar Al-CuAl2 Eutectic

Abstract

AbstractThe crystallographic substructure of a unidirectionally solidified Al-CuAl2 lamellar eutectic has been investigated by transmission electron microscopy. The two lamellar imperfections, fault lines and terminations, have been studied. The fault lines have been shown to be discrete subgrain boundaries, and at lamellar terminations a high density of nearly parallel dislocations is observed. A model is advanced to explain this dislocation array, based on the low misfit between {111}Al and {211}cuAl2 planes.