Resonance analysis for EMC improvement in integrated circuits

Abstract

To be compliant with electromagnetic compatibility standards, integrated circuits such as microcontrollers have to be robust to fast transient burst tests. Because of high voltage and fast transient voltage variations used no measurement is possible during the stress. Lack of information makes the debug of a product a real challenge. The objective of this work is to provide a measurement method which permits to have more information on the stress propagation on the power supply network. The methodology applied here on fast transient burst test could be extended to other kind of stress on power supply.