Considerations in selecting a design-for-testability technique

Abstract

The four major design-for-testability (DFT) techniques-ad hoc, built-in-self-test (BIST), structured, and semistructured approaches-differ widely in their ability to meet a products test needs. A few practical guidelines can aid in choosing the DFT approach that is best for your project. The techniques are reviewed, followed by a description of the selection criteria, and concluding with the various DFT techniques being compared using the criteria to do the tradeoff analysis.<>