Stanley Liu, H. Rutagemwa, Xuemin Shen, J. Mark, P. Ho
{"title":"Efficiency and throughput analysis of delayed-acknowledgement in WPANs","authors":"Stanley Liu, H. Rutagemwa, Xuemin Shen, J. Mark, P. Ho","doi":"10.1109/ICBN.2005.1589657","DOIUrl":null,"url":null,"abstract":"An analytical model for studying the performance of the delayed acknowledgement (Dly-ACK) mechanism in IEEE 802.15.3 over a fading channel is developed. A three-state Markov channel model is used to approximate both correlated and uncorrelated error processes. Explicit mathematical expressions for the goodput and efficiency of Dly-ACK are derived. It is found that the Dly-ACK mechanism yields higher goodput in a burst error environment than in a random error environment. The goodput tends to increase as the size of the burst increases; however, the amount of increase depends on the underlying delay. Simulations results are given to validate the analytical results.","PeriodicalId":113201,"journal":{"name":"2nd International Conference on Broadband Networks, 2005.","volume":"72 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2nd International Conference on Broadband Networks, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICBN.2005.1589657","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
An analytical model for studying the performance of the delayed acknowledgement (Dly-ACK) mechanism in IEEE 802.15.3 over a fading channel is developed. A three-state Markov channel model is used to approximate both correlated and uncorrelated error processes. Explicit mathematical expressions for the goodput and efficiency of Dly-ACK are derived. It is found that the Dly-ACK mechanism yields higher goodput in a burst error environment than in a random error environment. The goodput tends to increase as the size of the burst increases; however, the amount of increase depends on the underlying delay. Simulations results are given to validate the analytical results.