Open Top Socketed Evaluation Board for Bench Test and Fault Localization on GaAs RF Device

Abstract

Improving the cycle time through the development of techniques and enhancement of equipment aims customer satisfaction. Repetitive mounting and demounting on an evaluation board is one of the aspects that cause high cycle time. The open-top socketed evaluation board will be used for bench testing and fault localization eliminating the mounting and demounting process on the failure analysis flow of a specific GaAs radio frequency device and lessen the cycle time from sample preparation for failure verification until fault localization. The open-top socketed evaluation board achieved electrical specification parameters by the datasheet including supply current, gain, input and output return loss; matched emission sites on fault localization by LEM; eliminated mounting and demounting process, and saved 50.71 % of the processing time from sample preparation for failure verification up to sample preparation for physical analysis.