High performance air-cooled temperature margining thermal tools for silicon validation

R. Mohammed, R. Sahan, Yi Xia, Y. Pang
{"title":"High performance air-cooled temperature margining thermal tools for silicon validation","authors":"R. Mohammed, R. Sahan, Yi Xia, Y. Pang","doi":"10.1109/STHERM.2011.5767210","DOIUrl":null,"url":null,"abstract":"Thermal tools provide temperature margining capability by varying the case temperature at silicon thermal design power (TDP). They are used for process, voltage, temperature and frequency (PVTF) testing by Intel's post-silicon validation customers across servers, desktops, mobile and graphics segments. Thermal margining tools are widely used in silicon debug validation by varying the case temperature over a wide operating range of specifications of the Silicon to i) validate the silicon, ii) accelerate fault detection, and iii) reduce escapes and identify bugs. Thermal tool is controlled by a thermal controller to provide a temperature set-point based on the device under test's (DUT's) case or junction diode temperature. Air cooled thermal tool (AC-TT) employs a controller card to achieve the margining capability by running the tool's thermoelectric cooler (TEC), a Peltier device, within the optimal temperature range. AC-TT has an active heat sink design to remove the heat dissipated by the TEC and the silicon. Although AC-TT is expected to provide narrower range of margining capability due to the limitations of air cooling, they still can be an excellent solution for some specific thermal margining applications. Therefore, a new line of AC-TTs were developed for validation customers whose needs can be addressed without requiring costly controllers and noisy chillers while enhancing the user-experience. This paper presents the design improvement strategies implemented for developing the new line of CPU, Chipset and ASIC AC-TTs. Improved designs provide wider margining capability by using i) high performance active heat sink designs, ii) high power thermo-electric cooler (TEC), iii) cold plate designs compatible to keep out volume (KOV), iv) new choice of thermal interface material (TIM), and v) new retention design. This paper discusses the details of the design process and how multiple design strategies are implemented to finalize the design and to achieve the overall performance improvement while keeping the cost of the AC-TT low. The new line of AC-TT designs have performance improvement of 44% (∼25C) for 130W CPU TT compared to existing CPU AC-TT, of 32% (∼19C) for 60W chipset compared to existing chipset AC-TT, and of 41% (∼8C) compared to existing 15W PCH (Peripheral Component Hub) AC-TT. Design strategies provided here can be easily adapted to develop future generation of low-cost CPU, chipset, and ASIC AC-TTs with a wider margining capability.","PeriodicalId":128077,"journal":{"name":"2011 27th Annual IEEE Semiconductor Thermal Measurement and Management Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-03-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 27th Annual IEEE Semiconductor Thermal Measurement and Management Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.2011.5767210","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

Thermal tools provide temperature margining capability by varying the case temperature at silicon thermal design power (TDP). They are used for process, voltage, temperature and frequency (PVTF) testing by Intel's post-silicon validation customers across servers, desktops, mobile and graphics segments. Thermal margining tools are widely used in silicon debug validation by varying the case temperature over a wide operating range of specifications of the Silicon to i) validate the silicon, ii) accelerate fault detection, and iii) reduce escapes and identify bugs. Thermal tool is controlled by a thermal controller to provide a temperature set-point based on the device under test's (DUT's) case or junction diode temperature. Air cooled thermal tool (AC-TT) employs a controller card to achieve the margining capability by running the tool's thermoelectric cooler (TEC), a Peltier device, within the optimal temperature range. AC-TT has an active heat sink design to remove the heat dissipated by the TEC and the silicon. Although AC-TT is expected to provide narrower range of margining capability due to the limitations of air cooling, they still can be an excellent solution for some specific thermal margining applications. Therefore, a new line of AC-TTs were developed for validation customers whose needs can be addressed without requiring costly controllers and noisy chillers while enhancing the user-experience. This paper presents the design improvement strategies implemented for developing the new line of CPU, Chipset and ASIC AC-TTs. Improved designs provide wider margining capability by using i) high performance active heat sink designs, ii) high power thermo-electric cooler (TEC), iii) cold plate designs compatible to keep out volume (KOV), iv) new choice of thermal interface material (TIM), and v) new retention design. This paper discusses the details of the design process and how multiple design strategies are implemented to finalize the design and to achieve the overall performance improvement while keeping the cost of the AC-TT low. The new line of AC-TT designs have performance improvement of 44% (∼25C) for 130W CPU TT compared to existing CPU AC-TT, of 32% (∼19C) for 60W chipset compared to existing chipset AC-TT, and of 41% (∼8C) compared to existing 15W PCH (Peripheral Component Hub) AC-TT. Design strategies provided here can be easily adapted to develop future generation of low-cost CPU, chipset, and ASIC AC-TTs with a wider margining capability.
用于硅验证的高性能风冷温度边际热工具
热工具通过在硅热设计功率(TDP)下改变外壳温度来提供温度边际能力。它们被英特尔的后硅验证客户用于服务器、台式机、移动设备和图形领域的工艺、电压、温度和频率(PVTF)测试。热边际工具广泛用于硅调试验证,通过在硅规格的广泛操作范围内改变外壳温度来i)验证硅,ii)加速故障检测,以及iii)减少逃逸和识别错误。热工具由热控制器控制,根据被测器件(DUT)的外壳或结二极管温度提供温度设定点。风冷式热工具(AC-TT)采用控制卡,通过在最佳温度范围内运行工具的热电冷却器(TEC) (Peltier设备)来实现余量能力。AC-TT具有主动散热器设计,以消除TEC和硅散发的热量。尽管由于空气冷却的限制,AC-TT预计将提供更窄范围的边际能力,但它们仍然可以成为一些特定热边际应用的出色解决方案。因此,为验证客户开发了新的交流- tt系列,这些客户的需求可以在不需要昂贵的控制器和嘈杂的冷却器的情况下得到满足,同时增强用户体验。本文介绍了为开发新的CPU、芯片组和ASIC ac - tt系列而实施的设计改进策略。改进的设计通过使用i)高性能主动散热器设计,ii)大功率热电冷却器(TEC), iii)兼容的冷板设计来保持体积(KOV), iv)热界面材料(TIM)的新选择,以及v)新的保留设计,提供更广泛的余量能力。本文讨论了设计过程的细节,以及如何实施多种设计策略来完成设计并实现整体性能改进,同时保持AC-TT的低成本。与现有的CPU AC-TT相比,130W CPU TT的性能提高了44% (~ 25C), 60W芯片组与现有的芯片组AC-TT相比,性能提高了32% (~ 19C),与现有的15W PCH(外围组件集线器)AC-TT相比,性能提高了41% (~ 8C)。这里提供的设计策略可以很容易地用于开发下一代低成本CPU、芯片组和具有更广泛边际能力的ASIC ac - tt。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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