Automated EEG Artifact Detection Using Independent Component Analysis

Amira Echtioui, W. Zouch, M. Ghorbel, M. Slima, A. Hamida, C. Mhiri
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引用次数: 2

Abstract

In electroencephalogram (EEG) recordings, physiological and non-physiological artifacts pose many problems. Independent Component Analysis (ICA) is a widely used algorithm for removing different artifacts from EEG signals. It separates data in linearly Independent Components (IC). However, the evaluation and classification of the calculated ICs as an EEG or artifact is not currently automated which requires manual intervention to reject ICs with visually detected artifacts after decomposition. In this paper, we propose a new automated approach for artifacts detection using the ICA algorithm. The best result of mean square error was achieved using SOBI-ICA (Second Order Blind Identification) and ADJUST algorithms. Compared with the existing automated solutions, our approach is not limited to electrode configurations, number of EEG channels, or specific types of artifacts. It provides a practical tool, reliable, automatic, and real-time capable, which avoids the need for the time-consuming manual selection of ICs during artifacts rejection.
基于独立分量分析的自动脑电信号伪影检测
在脑电图(EEG)记录中,生理性和非生理性伪影造成了许多问题。独立分量分析(ICA)是一种广泛应用的去除脑电信号伪影的算法。它将数据分离为线性无关组件(IC)。然而,将计算出的集成电路作为EEG或伪影进行评估和分类目前还不是自动化的,这需要人工干预来拒绝分解后具有视觉检测到的伪影的集成电路。在本文中,我们提出了一种使用ICA算法进行伪影检测的新方法。采用SOBI-ICA(二阶盲识别)和ADJUST算法,均方误差得到了最好的结果。与现有的自动化解决方案相比,我们的方法不局限于电极配置,EEG通道数量或特定类型的工件。它提供了一个实用的、可靠的、自动的和实时的工具,避免了在工件拒绝过程中耗时的人工选择ic的需要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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