FPGA Delay Model Considering Logic-Level and Transistor-Level Parameters

Qiang Liu, HanJing Qian
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Abstract

Field programmable gate arrays (FPGAs) have been adopted in various fields, due to the design flexibility and customizability. Different applications have different requirements in performance, hardware resources and cost, leading to demands of diverse FPGA architectures. Delay is an important metric to evaluate different alternatives during FPGA architecture development. The existing analytical delay models for FPGAs mainly consider the logical architecture parameters. However, the variations of transistor-level parameters, Vdd and Vt, also have great influences on delay under the development trend of low-power design and deep sub-micron technology. To explore various design options at the early design stage and provide transistor-level accuracy, FPGA delay model considering Vdd and Vt is necessary. In this paper, an analytical model containing structural parameters of logic blocks and routing blocks as well as Vdd and Vt, is built to estimate the FPGA critical path delay.
考虑逻辑级和晶体管级参数的FPGA延迟模型
现场可编程门阵列(fpga)由于其设计的灵活性和可定制性,已被广泛应用于各个领域。不同的应用对性能、硬件资源和成本有不同的要求,导致对FPGA架构的需求也不同。在FPGA架构开发过程中,延迟是评估不同备选方案的重要指标。现有的fpga分析延迟模型主要考虑逻辑结构参数。然而,在低功耗设计和深亚微米技术的发展趋势下,晶体管级参数Vdd和Vt的变化对延迟也有很大的影响。为了在早期设计阶段探索各种设计选项并提供晶体管级精度,考虑Vdd和Vt的FPGA延迟模型是必要的。本文建立了包含逻辑块和路由块结构参数以及Vdd和Vt的分析模型来估计FPGA的关键路径延迟。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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