{"title":"Selectively-Implanted Collector Profile Optimisation for High-Speed Vertical Bipolar Transistors","authors":"M. S. Peter, G. Hurkx, C. E. Timmering","doi":"10.1109/ESSDERC.1997.194427","DOIUrl":null,"url":null,"abstract":"The in uence of a selectively-implanted collector on the performance of a high-speed vertical bipolar transistor has been studied using Design of Experiments methods. Depending on the epilayer thickness two different types of behaviour are found for fT,max and BVCE0.","PeriodicalId":424167,"journal":{"name":"27th European Solid-State Device Research Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"27th European Solid-State Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.1997.194427","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
The in uence of a selectively-implanted collector on the performance of a high-speed vertical bipolar transistor has been studied using Design of Experiments methods. Depending on the epilayer thickness two different types of behaviour are found for fT,max and BVCE0.