Reliability analysis of a 65nm Rad-Hard SRAM-Based FPGA for CERN applications

Abstract

In search of alternative solutions for Field Programmable Gate Arrays (FPGA) that can withstand the higher dose levels foreseen in the upcoming upgrades of the Large Hadron Collider (LHC), a new Radiation Hardened FPGA is targeted. More specifically, in this work, the effects of proton induced radiation on a 65nm Rad Hard SRAM-Based FPGA are investigated, while applying tailored tests for each resource of the FPGA. The results of the study are then used to perform a Reliability analysis of this device, adapted to the CERN radiation environment while using standard models.