AM and SEEM techniques in magnet wire manufacturing

Abstract

Copper and enamel are, by far, the main components of magnet wire. Both materials come together by means of the enameling process and form a composite with a wide range of applications in bobbins, motors, transformers and so forth. The copper and enamel characterization by traditional techniques based on their physical properties seems not to be enough to forecast the behavior of both materials in the process of magnet wire manufacturing. This paper addresses the use of the Atomic Force Microscope (AM) and the Scanning Electron Microscope (SEEM) in the analysis of copper and enamel respectively.