{"title":"Instantaneous image observation of ultrafast electrical pulse propagating on metal strip","authors":"K. Takeuchi, A. Mizuhara","doi":"10.1109/MWP.1996.660358","DOIUrl":null,"url":null,"abstract":"Instantaneous potential distribution of 2 ps propagating pulse was visualized using a scanning force optoelectronic microscope. A special probe made of low temperature grown GaAs is the key in the optical sampling measurement.","PeriodicalId":433743,"journal":{"name":"International Topical Meeting on Microwave Photonics. MWP '96 Technical Digest. Satellite Workshop (Cat. No.96TH8153)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Topical Meeting on Microwave Photonics. MWP '96 Technical Digest. Satellite Workshop (Cat. No.96TH8153)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWP.1996.660358","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Instantaneous potential distribution of 2 ps propagating pulse was visualized using a scanning force optoelectronic microscope. A special probe made of low temperature grown GaAs is the key in the optical sampling measurement.