{"title":"Open-circuit fault diagnosis in interleaved DC-DC boost converters and reconfiguration strategy","authors":"F. Bento, A. Cardoso","doi":"10.1109/DEMPED.2017.8062385","DOIUrl":null,"url":null,"abstract":"The use of electronic equipment and other DC-compatible appliances in dwellings and offices is increasing at a very fast rate, as well as the distributed generation of energy. These two statements will certainly trigger, in a near future, the adoption of district-scale DC grids, connecting DC micro-generation plants and consumers, in an effort to cut the number of conversion steps required to deliver power to DC appliances. DC-DC converters will be fundamental in these systems, allowing the creation of several voltage levels. The reliability of these converters plays a key role, ensuring service continuity of the loads connected to them. With the increase of reliability in mind, this paper applies an open-circuit fault-diagnostic method suitable for several DC-DC converter topologies. A new reconfiguration strategy is proposed to mitigate the adverse impacts of such faults. To prove the effectiveness of these strategies, a three-phase interleaved boost converter prototype was used in the experiments.","PeriodicalId":325413,"journal":{"name":"2017 IEEE 11th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 11th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DEMPED.2017.8062385","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 18
Abstract
The use of electronic equipment and other DC-compatible appliances in dwellings and offices is increasing at a very fast rate, as well as the distributed generation of energy. These two statements will certainly trigger, in a near future, the adoption of district-scale DC grids, connecting DC micro-generation plants and consumers, in an effort to cut the number of conversion steps required to deliver power to DC appliances. DC-DC converters will be fundamental in these systems, allowing the creation of several voltage levels. The reliability of these converters plays a key role, ensuring service continuity of the loads connected to them. With the increase of reliability in mind, this paper applies an open-circuit fault-diagnostic method suitable for several DC-DC converter topologies. A new reconfiguration strategy is proposed to mitigate the adverse impacts of such faults. To prove the effectiveness of these strategies, a three-phase interleaved boost converter prototype was used in the experiments.