A new method for path criticality calculation

Abstract

Technology scaling and manufacturing process affect the performance of digital circuits, making them more vulnerable to environmental influences. Some defects are manifested as delay faults. Some various factors have impact to signal propagation delay. A new method is presented for determining factors impact measurement on the path delay in the digital circuits. The method is focused to find the best weights of the factors used as parameters for the PaCGen (Parameterized Critical Path Generator) system. PaCGen is used for critical paths selection based on static timing analysis data with impact of factors to propagation delay. Experimental results are provided using the ISCAS'89 benchmark circuits.