A 0.0285mm2 0.68pJ/bit Single-Loop Full-Rate Bang-Bang CDR without Reference and Separate Frequency Detector Achieving an 8.2(Gb/s)/µs Acquisition Speed of PAM-4 data in 28nm CMOS

Xiaoteng Zhao, Yong Chen, Pui-in Mak, R. Martins
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引用次数: 8

Abstract

A single-loop full-rate bang-bang CDR without the reference and separate frequency detector (FD) is reported. Its phase detector innovates a strobe-point selection scheme and a hybrid control circuit to automate and accelerate the frequency acquisition over a wide frequency range. Prototyped in 28nm CMOS, our CDR achieves a 23-to-29Gb/s capture range of four-level pulse amplitude modulation (PAM-4) data. The acquisition speed [8.2(Gb/s)/µs], die area (0.0285mm2) and energy efficiency (0.68pJ/bit) compare favorably with the prior art.
一个0.0285mm2 0.68pJ/bit单回路全速率Bang-Bang CDR,无参考和独立频率检测器,在28nm CMOS中实现了8.2(Gb/s)/µs的PAM-4数据采集速度
报道了一种无需参考和分离频率检测器(FD)的单回路全速率bang-bang CDR。其相位检测器创新了频闪点选择方案和混合控制电路,在宽频率范围内实现了自动化和加速频率采集。我们的CDR以28nm CMOS为原型,实现了23- 29gb /s的四电平脉冲幅度调制(PAM-4)数据捕获范围。采集速度[8.2(Gb/s)/µs]、芯片面积(0.0285mm2)和能效(0.68pJ/bit)均优于现有技术。
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