ZernikeNet: a deep learning-based approach for accurate Zernike coefficients calculation in aspheric optical components

Shinwook Kim, Y. Youk, Goeun Kim, D. Ryu, Jeeyeon Yoon
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Abstract

This paper presents a new method called ZernikeNet for accurately calculating Zernike coefficients in aspheric optical components. Surface figure error (SFE) measurements obtained using interferometer often include alignment errors and low-order aberrations, such as piston, tip, tilt, and defocus, which need to be removed to effectively analyze high-order aberrations. The traditional method for removing low-order aberrations involves Zernike polynomial fitting to the SFE, but this assumes that the optical component is circular and can be decomposed into an orthogonal basis set of Zernike polynomials. However, for aspheric optical components, the orthogonality of Zernike polynomials may not hold, making it challenging to accurately represent the SFE. To address this challenge, ZernikeNet employs a deep learning-based approach, where interferometer map of the optical component is fed into a multi-layer neural network structure to output a set of 36 Zernike coefficients. The proposed deep learning network is trained using a single-shot metrology approach, where a single input interferometer map is used to generate high-accuracy Zernike coefficients through intentional overfitting. Experimental results using data from aspheric mirror show that ZernikeNet can effectively remove low-order aberrations, leaving only high-order aberrations, resulting in a low residual SFE RMS value. This method offers a significant advantage over traditional Zernike polynomial fitting approaches for optical components with complex shapes, making it a promising tool for the design and analysis of advanced optical systems.
ZernikeNet:一种基于深度学习的非球面光学元件Zernike系数精确计算方法
本文提出了一种精确计算非球面光学元件泽尼克系数的新方法ZernikeNet。使用干涉仪测量得到的表面图形误差(SFE)通常包括对准误差和低阶像差,如活塞、尖端、倾斜和离焦,需要去除这些像差才能有效地分析高阶像差。传统的消除低阶像差的方法是将Zernike多项式拟合到SFE中,但这种方法假设光学元件是圆形的,并且可以分解为一个正交的Zernike多项式基集。然而,对于非球面光学元件,Zernike多项式的正交性可能不成立,这使得精确表示SFE具有挑战性。为了应对这一挑战,ZernikeNet采用了一种基于深度学习的方法,将光学元件的干涉仪图馈送到多层神经网络结构中,以输出一组36个Zernike系数。所提出的深度学习网络使用单次计量方法进行训练,其中使用单输入干涉仪图通过故意过拟合生成高精度泽尼克系数。利用非球面反射镜数据的实验结果表明,ZernikeNet能有效去除低阶像差,只留下高阶像差,得到较低的残余SFE RMS值。对于具有复杂形状的光学元件,该方法比传统的Zernike多项式拟合方法具有显著的优势,使其成为设计和分析先进光学系统的有前途的工具。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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