A High-Performance Fault Diagnosis Approach for the AES SubBytes Utilizing Mixed Bases

Mehran Mozaffari Kermani, A. Reyhani-Masoleh
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引用次数: 45

Abstract

The Sub Bytes (S-boxes) is the only non-linear transformation in the encryption of the Advanced Encryption Standard (AES), occupying more than half of its hardware implementation resources. One important required aspect of the hardware architectures of the S-boxes is the reliability of their implementations. This can be compromised by occurrence of internal faults or intrusion of the attackers. In this paper, we present a high-speed architecture for the S-boxes constructed using mixed bases to counteract these internal/malicious faults. Although using polynomial and normal bases for the S-boxes has been studied extensively, using mixed bases has just been considered very recently in CHES 2010. In the proposed fault detection scheme of this paper, we present formulations for multi-bit parities for the S-boxes using mixed bases. Then, these formulations are utilized in our error simulations and it is shown that the presented architecture reaches very high error coverage. Through our ASIC syntheses utilizing a 65-nm CMOS technology, we show that with comparable hardware complexity, the efficiency of the presented reliable architecture (without sub-pipelining) reaches around $5.02$ $\frac{Mbps}{\mu m^{2}}$, outperforming other fault detection schemes for composite field architectures.
基于混合基的AES子字节高性能故障诊断方法
子字节(s -box)是高级加密标准AES (Advanced encryption Standard)加密中唯一的非线性转换,占用其硬件实现资源的一半以上。s -box硬件体系结构的一个重要要求是其实现的可靠性。这可能会因内部故障的发生或攻击者的入侵而受到损害。在本文中,我们提出了一种使用混合基构造的s盒的高速架构来抵消这些内部/恶意故障。虽然对s -box使用多项式基和正态基进行了广泛的研究,但在chs2010中,使用混合基才刚刚被考虑。在本文提出的故障检测方案中,我们给出了使用混合基的s盒的多位校验公式。然后,将这些公式应用于我们的误差模拟中,结果表明所提出的体系结构达到了很高的误差覆盖率。通过我们利用65纳米CMOS技术的ASIC合成,我们表明,在硬件复杂性相当的情况下,所提出的可靠架构(没有子流水线)的效率达到$5.02$$\frac{Mbps}{\mu m^{2}}$左右,优于复合现场架构的其他故障检测方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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