AlGaAs/GaAs avalanche detector array -1 GBit/s X-ray receiver for timing measurements

J. Lauter, A. Forster, H. Luth, K. D. Muller, R. Reinartz
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引用次数: 16

Abstract

We report on the first realization of 2/spl times/2 detector arrays based on an aluminum gallium arsenide/gallium arsenide (AlGaAs/GaAs) heterostructure avalanche photodiodes. These structures consists of a GaAs absorption layer and an AlGaAs/GaAs avalanche layer which acts as an multiplication region. The samples were grown by molecular beam epitaxy (MBE) and processed into p-i-n diodes of different diameters. Dark current densities were as low as 200 pA/mm/sup 2/ at 90% of the breakdown voltage as determined by I-V measurements. The avalanche gain of the devices have been measured with optical pulses. Gains up to a factor of M=1000 have been determined before breakdown. Additionally the excess noise factor F(M) has been derived for gains between M=1 and M=300. The ionization rates ratio of the structure is k=/spl alpha///spl beta/=3.4/spl plusmn/0.3. In connection to a fast electronic readout chain the time response of the detectors to 14.4 keV X-ray photons has been tested at the ESRF (Grenoble). The time resolution was found to be 200 ps (FWHM) using standard timing electronics.
AlGaAs/GaAs雪崩探测器阵列-1 GBit/s x射线接收机,用于定时测量
本文报道了基于砷化铝镓/砷化镓(AlGaAs/GaAs)异质结构雪崩光电二极管首次实现的2/ sp1倍/2探测器阵列。这些结构由砷化镓吸收层和作为倍增区的AlGaAs/GaAs雪崩层组成。采用分子束外延法(MBE)对样品进行生长,并加工成不同直径的p-i-n二极管。通过I-V测量确定,在90%击穿电压下,暗电流密度低至200 pA/mm/sup 2/。用光脉冲测量了器件的雪崩增益。在击穿之前,已确定增益高达M=1000的因数。此外,对于M=1和M=300之间的增益,导出了多余噪声因子F(M)。该结构的电离率比为k=/spl α ///spl β /=3.4/spl plusmn/0.3。在格勒诺布尔ESRF上测试了探测器对14.4 keV x射线光子的时间响应,并与快速电子读出链相连接。使用标准定时电子器件,发现时间分辨率为200ps (FWHM)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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