V. Pershenkov, S. Cherepko, V. Belyakov, V. Abramov, V. I. Rusanovsky, A. Sogoyan, V. Rogov, V. N. Ulimov, V. Emelianov, V. S. Nasibullin
{"title":"The simulation of the low dose-rate radiation effect in bipolar devices","authors":"V. Pershenkov, S. Cherepko, V. Belyakov, V. Abramov, V. I. Rusanovsky, A. Sogoyan, V. Rogov, V. N. Ulimov, V. Emelianov, V. S. Nasibullin","doi":"10.1109/RADECS.1997.698846","DOIUrl":null,"url":null,"abstract":"Experimental techniques for bipolar low dose-rate effect investigation and simulation are presented. The techniques utilize the bulk and peripheral recombination current separation and infrared illumination during high dose-rate laboratory test.","PeriodicalId":106774,"journal":{"name":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","volume":"77 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.1997.698846","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Experimental techniques for bipolar low dose-rate effect investigation and simulation are presented. The techniques utilize the bulk and peripheral recombination current separation and infrared illumination during high dose-rate laboratory test.