Circuit Field Coupling Model of ESD Setup for Automotive Testing

Abstract

In this paper, we demonstrate the circuit representation of the field coupled ESD setup for automotive testing according to ISO 10605. The circuit model consists of parasitic lumped elements, extracted from the test setup by 3D quasi-static field solvers. For ESD testing, an equivalent model of the setup is incorporated into circuit model of device under test and working conditions are monitored by means of levels of transient currents and voltages in the system.