{"title":"Verification of System Specifications of a High Performance Network Analyzer","authors":"R. Pollard","doi":"10.1109/ARFTG.1984.323576","DOIUrl":null,"url":null,"abstract":"The usual way in which a microwave measurement system is specified provides a statement of accuracy under stated conditions. Independently calibrated parts are employed to verify that the system is performing to specification at specific points. This contribution discusses the specification of a network analyser in terms of the effective characteristics of the measurement ports after calibration. It is then possible to calculate the accuracy of measurement possible for a given calibration technique and device under test and to devise a technique for the verification of the specification of the measurement port characteristics.","PeriodicalId":137724,"journal":{"name":"23rd ARFTG Conference Digest","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1984-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"23rd ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1984.323576","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24
Abstract
The usual way in which a microwave measurement system is specified provides a statement of accuracy under stated conditions. Independently calibrated parts are employed to verify that the system is performing to specification at specific points. This contribution discusses the specification of a network analyser in terms of the effective characteristics of the measurement ports after calibration. It is then possible to calculate the accuracy of measurement possible for a given calibration technique and device under test and to devise a technique for the verification of the specification of the measurement port characteristics.