Analysis of Measurement Uncertainty for 5G OTA Measurement Grid Above 3 GHz

2022 IEEE 5th International Conference on Electronic Information and Communication Technology (ICEICT) Pub Date : 2022-08-21 DOI:10.1109/ICEICT55736.2022.9909298

Lei Chen, Siyang Sun, Xiaochen Chen, Zhanyuan Gao, Xuan Yi, Peihua Wang

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Abstract

OTA testing is mandatory for 5G wireless devices. Protocols with frequency above 3 GHz, such as high-band WiFi and V2X, tend to have longer testing times for TIS. Due to the proliferation of such devices and bands, testing time reduction is of great significance. Among all potential methods, measurement grid reduction is a more effective one. This paper evaluates the effect of different measurement grid distribution on OT A performance of 5G wireless devices operating above 3 GHz. The determination of associated measurement uncertainty (MU) term is proposed and characterized based on statistical analysis. The reasonable MU limit for grid distribution is also proposed. Based on this work, it can be found that reduction of TIS measurement grid resolution from currently required 30/30 (AO/

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3ghz以上5G OTA测量网格测量不确定度分析

5G无线设备必须进行OTA测试。频率在3ghz以上的协议，如高频段WiFi和V2X，往往需要更长的TIS测试时间。由于此类器件和频段的激增，减少测试时间具有重要意义。在所有可能的方法中，测量网格约简是一种较为有效的方法。本文评估了不同测量网格分布对3ghz以上5G无线设备OT - A性能的影响。提出了关联测量不确定度(MU)项的确定方法，并基于统计分析对其进行了表征。并提出了合理的配网MU限值。通过本工作可以发现，将TIS测量网格分辨率从目前要求的30/30 (AO/

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2022 IEEE 5th International Conference on Electronic Information and Communication Technology (ICEICT)

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