{"title":"Digital DC Resistance Tester","authors":"Tieyuan Chang, Jingjing Zhang, Wenjun Chen","doi":"10.1109/ICFN.2010.54","DOIUrl":null,"url":null,"abstract":"This test method adopted the method of four-wire test to eliminate the influence of the lead resistance and the contact resistance effectively. And design the automatically selects the range of the circuit to measure the values of different resistance. We use two A/D converters to enlarge the values of voltage and current at the same time, and using software programming to realize the processing and displaying of the data.","PeriodicalId":185491,"journal":{"name":"2010 Second International Conference on Future Networks","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Second International Conference on Future Networks","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICFN.2010.54","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This test method adopted the method of four-wire test to eliminate the influence of the lead resistance and the contact resistance effectively. And design the automatically selects the range of the circuit to measure the values of different resistance. We use two A/D converters to enlarge the values of voltage and current at the same time, and using software programming to realize the processing and displaying of the data.