{"title":"Modeling left-truncated degradation data using random drift-diffusion Wiener processes","authors":"B. Yan, Han Wang, Xiaobing Ma","doi":"10.1080/16843703.2023.2187011","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":229439,"journal":{"name":"Quality Technology & Quantitative Management","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Quality Technology & Quantitative Management","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/16843703.2023.2187011","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}